NT-MDT AFM Probes

In Scanning Probe Microscopy, the perfect instrument is only half of the story. The probe is equally important. NT-MDT offers a wide assortment of SPM probes, ranging from the routine silicon and polysilicon cantilevers to ultra-sharp diamond-like carbon tips , probes with different coatings , for magnetic measurements , probes for SNOM and many others. To keep your instrument properly calibrated, we carry an extensive array of multiple calibration gratings as well as test samples with free deconvolution software. And, to assure that we can offer you the most advanced probes to supplement our product line, now and in the future, we've made probe development a key component of our R&D program.